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Measurements

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DESIGN OF RF & MICROWAVE DEVICES
SYSTEMS AND APPLICATIONS
MEASUREMENTS
Characterisation of high frequency components

Material characterization

Know-How and expertise

  • 3D electromagnetism and complex systems simulations
  • Development of original analytic methods
    for CEM problematics
  • Pre-qualification measurements
  • Material characterization
  • RF and millimeter-wave circuit characterization
  • Antenna measurements

Areas of application

  • Terrestrial and space telecommunications
  • Defence
  • Cellular and wireless communications
  • transportation

Experimental and/or simulatory resources

  • Compact millimeter-wave base (far field measurements from 8 GHz to 110 GHz)
  • Free-space focused material characterization bench operating between 5 and 110 GHz. This bench can handle homogeneous, multi-layers, dielectrics, or magnetics materials.
  • VNA ZVA67 with ZVA-Z110 extension enabling 4-ports RF systems measurements up to 110GHz (wave-guides, antennas, cavities, passive and active devices).
  • Semi-anechoic room for EMC tests
  • XLIM Laboratory’s PLATINUM platform access.

Emmanuel PERRIN

Responsable d’axe
perrin@cisteme.net
05 19 09 00 34